Conference · 2024

Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks

B Suvarna, R Vidhya Sagar, T Havish, B Sridevi, A Sampath

Cited by 4 2024 IEEE 3rd World Conference on Applied Intelligence and … DOI

Abstract

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2026
2024

Publication details

Venue
2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024
Type
Conference · 2024
DOI
10.1109/AIC61668.2024.10730982
Citations
4 · via Crossref, 19 September 2026

Cite this publication

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APA

Suvarna, B., Sagar, R. V., Havish, T., Sridevi, B., & Sampath, A. (2024). Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks. 2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024. https://doi.org/10.1109/AIC61668.2024.10730982

Harvard

Suvarna, B., Sagar, R.V., Havish, T., Sridevi, B. and Sampath, A. (2024) 'Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks', 2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024. doi: 10.1109/AIC61668.2024.10730982.

IEEE

B. Suvarna, R. V. Sagar, T. Havish, B. Sridevi, and A. Sampath, "Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks," 2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024, 2024. doi: 10.1109/AIC61668.2024.10730982.

Vancouver

Suvarna B, Sagar RV, Havish T, Sridevi B, Sampath A. Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks. 2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024. 2024. doi: 10.1109/AIC61668.2024.10730982.

MLA

Suvarna, B, et al.. "Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks." 2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024, 2024. https://doi.org/10.1109/AIC61668.2024.10730982.

Chicago

Suvarna, B., Sagar, R. V., Havish, T., Sridevi, B., Sampath, A.. "Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks." 2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024 (2024). https://doi.org/10.1109/AIC61668.2024.10730982.

BibTeX

@inproceedings{suvarna2024, title={Plant Leaf Disease Detection Using EfficientNetB7 and L1-Regularized Neural Networks}, author={Suvarna, B and Sagar, R Vidhya and Havish, T and Sridevi, B and Sampath, A}, booktitle={2024 IEEE 3rd World Conference on Applied Intelligence and Computing, AIC 2024}, year={2024}, doi={10.1109/AIC61668.2024.10730982}, }

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